####################################################
# joseph woicik <woicik@bnl.gov>
# requesting 14 days, at minimum=12 days
# beamline 33BM, diffraction of strained Si on SiO2 and Si on SiGe and BaSrTiO3/SrTiO3 on Si
# instrument 33BM-C fourc
####################################################
# top:/home/www/beamtime-requests/req00563.txt
# UNICAT Member Beam Time Request  #563
# created Sun Mar 28 18:29:27 CST 2004
####################################################

beamline:
	33BM

collaboration:
	No

collaborator_Paul:
	ON

contact:
	woicik@bnl.gov

days:
	14

description:
	diffraction at 33BM-C will be performed on thin films on Si

equipment_required:
	

experiment:
	diffraction of strained Si on SiO2 and Si on SiGe and BaSrTiO3/SrTiO3 on Si

foreign_nationals:
	

hazards:
	None

instrument:
	33BM-C fourc

instrument_other:
	

minimumdays:
	12

name:
	joseph woicik

nonmembers:
	

unacceptable_dates:
	May 16 - 18

z34ID_details:
	


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