####################################################
# Yang Da <yangda@uiuc.edu>
# requesting 7 days, at minimum=5 days
# beamline 34ID-C, Coherent diffraction from dislocations and strain in GeSi/Si interfaces
# instrument 34ID-C coherent
####################################################
# top:/home/www/beamtime-requests/req00671.txt
# UNICAT Member Beam Time Request  #671
# created Tue Aug 24 16:31:55 CDT 2004
####################################################

beamline:
	34ID-C

collaboration:
	No

contact:
	yangda@uiuc.edu

days:
	7

description:
	I have done similar experiment last time and this time I will using another sample, which the Si film's thickness is near the critical thickness. Thus there are fewer dislocations in my beam size. Wenge Yang has done microbeam diffraction experiment on the same sample in APS sector34ID-E.  I will use mirrors to focus the beam to micron size and beam is grazing incidence to the sample surface. I'm interested in the coherent diffraction pattern from the dislocations at the GeSi/Si interfaces. Also I will try some new samples such as Ge nanowire on Si substrate and Quantum dots sample.

equipment_required:
	KB mirrors

experiment:
	Coherent diffraction from dislocations and strain in GeSi/Si interfaces

foreign_nationals:
	Yang Da

hazards:
	none

instrument:
	34ID-C coherent

instrument_other:
	

minimumdays:
	5

name:
	Yang Da

nonmembers:
	

unacceptable_dates:
	

z34ID_change_undulator:
	no

z34ID_details:
	

z34ID_parasitic:
	yes


#REMOTE_HOST: yang-m.mrl.uiuc.edu
#REMOTE_ADDR: 130.126.101.162
#CONTENT_LENGTH: 977
#HTTP_REFERER: http://www.uni.aps.anl.gov/unireq.htm
#HTTP_USER_AGENT: Mozilla/4.0 (compatible; MSIE 6.0; Windows NT 5.1; .NET CLR 1.1.4322)