####################################################
# Yuri Shvyd'ko, APS, XSD <shvydko@aps.anl.gov>
# requesting 2 days, at minimum=1 days
# beamline 33BM, X-ray topography characterisation of Si crystals for angular dispersive IXS spectrometer
# instrument 33BM-B topography
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# top:/home/www/beamtime-requests/req01118.txt
# UNICAT Member Beam Time Request  #1118
# created Thu Dec 21 14:11:43 CST 2006
####################################################

apsrun:
	2007-01

beamline:
	33BM

collaboration:
	No

contact:
	shvydko@aps.anl.gov

days:
	2

description:
	We would like to use two-crystal  x-ray topography to characterize Si crystals 
for angular dispersive  Very High Resolution  Inelastic X-Ray Scattering Spectroscopy. 
We would like to use 9.1 keV x-rays for this purpose.
Required beam size: 5-8 mm (V) x 10 mm (H)

Relevant publications are:

Yu. V. Shvyd'ko, M. Lerche , U. Kuetgens,  H. D. Rueter,
  A. Alatas, J. Zhao
  ``X-Ray Bragg Diffraction  in Asymmetric Backscattering Geometry'', Phys. Rev. Lett., 97 (2006) 235502.

Yu. V. Shvyd'ko, U. Kuetgens, H. D. Rueter, M. Lerche,
  A. Alatas, J. Zhao
  ``Progress in the Development of New Optics for Very High Resolution
  Inelastic X-Ray Scattering Spectroscopy'', AIP Conference Proceedings
  879  (2006) 737-745.

equipment_required:
	Topography set-up, CCD camera for rough imaging, x-ray films for high-resolution imaging.

experiment:
	X-ray topography characterisation of Si crystals for angular dispersive IXS spectrometer

foreign_nationals:
	

hazards:
	No hazardous materials, samples, or procedures.

instrument:
	33BM-B topography

instrument_other:
	

minimumdays:
	1

name:
	Yuri Shvyd'ko, APS, XSD

new_request:
	ON

nonmembers:
	Yuri Shvyd'ko (XSD),  Xianrong Huang (XSD), Michael Lerche (XSD)

submit:
	Submit

unacceptable_dates:
	Most favorable time  would be beginning of the run starting Jan 30, 2007.

z34ID_details:
	


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